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Beckman Foundation Awards UCSF and IND Faculty to Advance Research Using Focused Ion Beam (FIB) Milling of Cellular Samples

Announcement

Beckman Foundation Awards UCSF and IND Faculty to Advance Research Using Focused Ion Beam (FIB) Milling of Cellular Samples

The Arnold and Mabel Beckman Foundation announced Dec. 6 an award to a UCSF team comprised of IND faculty Daniel Southworth (Principal Investigator) and Carlo Condello, along with William Degrado, Robert Edwards and David Agard, through its FIB-Milling Sample Preparation for Cellular CryoET program.

The $1.5 million dollar grant will support equipment acquisition and research development for focused ion beam (FIB) milling methodology combined with high-resolution cryo-electron tomography to investigate the cellular ultrastructure associated with neurodegenerative diseases.

For further information on the FIB-Milling Sample Preparation for Cellular CryoET program awards, visit the Beckman Foundation web site and Twitter.

December 07, 2021
Alzheimer’s Disease
Southworth Lab